device-characterization

Modular gm/ID design studio: load a full DC parameter sweep at once, then open each parameter in its own window. 2D curve families with draggable cursors and slope measurement, on-demand 3D surfaces, reverse-design lookup, and a local data library. Built with PySide6 + matplotlib.

Hands-on BC141 BJT characterization using an MPI probe station and Keysight B1500A with EasyEXPERT, documenting probe alignment, electrical contacting, and characteristic measurements.

Topology-aware Python toolkit and metadata standard for reproducible benchmarking of memory and adaptive electronic devices.

A Python toolkit for automated analysis and visualization of OLED J-V-L, current efficiency, and EQE data.

Python tools for parsing Keysight IC-CAP MDM files and WaferPro CSV measurement data. Generate interactive HTML reports for analyze semiconductor device measurements.

Reproducible PTM 45 nm HP/LP NMOS analysis using ngspice and Python